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Showing results: 226 - 240 of 582 items found.

  • Test Adapter

    cPCI/VME/VME64x - Kontron

    The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.

  • 1149.6 Boundary Scan Feature, GTE 10.00p

    K8213A - Keysight Technologies

    Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.

  • 1149.6 Boundary Scan Feature, GTE 10.00p

    K8213B - Keysight Technologies

    Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.

  • Debug Fixture

    IST Engineering, INC.

    With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.

  • Flying Probe Tester

    Pilot 4D L4 - SEICA SpA

    The Pilot 4D L4 represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system. Thanks to its integrated SMEMA conveyor, the Pilot 4D L4 can be combined with automatic load/unload magazines or lines, executing in-circuit, functional and visual tests of electronic boards in a completely automated mode. This is the ideal solution for medium and even high volume production test needs. The large test area can accommodate 21” x 24” boards (540 x 610 mm) board with split test. The ATE rack can be expanded with up to 1032 analog channels, connectable to an optional external bed of nails test fixture (TPM).

  • XJLink2-CFM

    XJTAG Ltd.

    The XJLink2-CFM is an advanced multi-TAP JTAG controller that fits into one of four Custom Function Module (CFM) locations on a Teradyne Multi-Function Application Board. It offers convenient, integrated access to XJTAG’s powerful test and programming tools from Teradyne’s TestStation™ In-Circuit Test Systems.

  • ICD 3 Test Interface Module

    AC164113 - Microchip Technology Inc.

    The Test Interface Board is an aid to isolate application interfacing problems when using the MPLAB ICD 3 (DV164035) as a debugger or programmer. Using the Test Interface Board and running confidence-test options under MPLAB IDE allows testing of the basic functions and signals of an MPLAB ICD 3. The diagnostic results under MPLAB IDE let the user know when the MPLAB ICD 3 is fully functional or if there is a malfunction. The MPLAB Online Help shows the user how to determine possible causes of hardware communication failures with the application.

  • Wire/Cable Harness Tester

    PANTHER 4HT - Qmax Test Technologies Pvt. Ltd.

    The Panther 4HT Wire \ Cable Harness tester is designed for Automotive and Semiconductor industry to apply in testing of wire harnesses, that needs testing during production with whole new fleet of features that make the task reliable, complete and fast. It uses innovative technology to test the impedance values. It can be interfaced to any type of fixtures as required. It uses the Learn and Compare technique for finding out opens or shorts in a harness. The learnt open / short combination from a Good Board is taken as reference and compared with the Board Under Test for any mismatch.

  • High Node Count In-Circuit Test Fixtures

    HNC Test Fixture - Circuit Check, Inc.

    Circuit Check continues to be a leading edge provider of custom engineered test solutions with our new Keysight i3070 HNC test fixture. Working with Keysight Technologies during the development of their HNC adapter in 2011, we were the first test fixture provider to offer customers with a solution to test large node count boards. High node count test fixtures can handle greater than 10,000 probes.

  • Time Domain Reflectometers and S-Parameter Analyzers

    Teledyne LeCroy

    The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.

  • GPIB Controlled Signal Routing Box

    GPIB - Test Electronics

    Test Electronics will customize the TE3000 GPIB signal routing box for your test application. Then, you simply rack and stack all the equipment, cable all the switched signals to the back of this GPIB box, add a rack mount computer, plug in the National Instruments GPIB board and software. Then run your customized GPIB based test system.

  • Push-Pull Flexible Cables

    YOKOWO Co., Ltd.

    New FPC connectors corresponding to the manufacturer’s recommended flexible board thickness of 0.15 mm and 0.2 mm for 0.3 mm pitch and 0.25 mm and 0.3 mm for 0.5 mm pitch are affixed to a proud plate and inserted and disconnected 10 times. The connectors are replaced with new connectors after checking conductivity, and the test is repeated with the number of insertion/disconnection cycles recorded for each pitch and board until conductivity fails.he boards are inserted and disconnected manually, taking care to insert and disconnect horizontally. The boards are inserted with the connector opened and disconnected with the connector closed.(Durability figures are guidelines, not guarantees. Actual performance will depend on connector specifications and conditions of use. Hold connectors close to the pins when inserting and disconnecting.)

  • In-Circuit Test System

    TestStation LX - Teradyne, Inc.

    TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.

  • MTM Evaluation Kit

    Acroname, Inc

    The MTM Evaluation Kit is a convenient way to get starting using MTM modules. It also serves as a perfect development system when designing your own test-point carrier board. The MTM Development Board has slots and breakouts for one MTM-USBStem or MTM-EtherStem, MTM-IO-Serial, and MTM-PM-1 and one policy-free slot which can be used for custom modules or for your own test hardware.

  • Dip Clip, 14 Pin With Nickel Silver Contacts

    5114 - Pomona Electronics

    Pomona DIP Clip? test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.

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